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Line Card

Brand:Frontier Semiconductor

Place of Origin:U.S.A

Model:Line Card

Keyword tag:Film Stress;FEOL Electrical Characterization;Thin wafer metrology;Line Card
021-37018108Online Message

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3DIC TSV and BWS TTV
Film Stress
FEOL Electrical Characterization
Thin wafer metrology
Film AdhesionGlobal Film Stress Adhesion
Local and Lattice Stress
Thickness, Topography & Geometry
Contact and Non-Contact Sheet Resistance

Metrology Tools forSemiconductor, LED, Solar, FPD, MEMS, Data Storage

 

 

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